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CM-3700A Benchtop Spectrophotometer

The CM-3700A spectrophotometer provides the highest level in accuracy and reliability available in a bench top unit. It features aperture masks, a large sphere, and a complete optical system, going above and beyond international standard requirements. Emitting a high power xenon flash when a measurement takes place, this instrument ensures the most accurate measurement is taken.

Features

  • ◉ Konica Minolta's advanced optical, sensing, and signal processing technology provide excellent repeatability.
  • ◉ Illumination/viewing geometry conforms to CIE, ISO, ASTM, DIN, and JIS requirements for di:8°, de:8° (diffuse illumination/8° viewing) geometry for reflectance and to CIE, ASTM, DIN, and JIS requirements for transmittance.
  • ◉ Strictly selected high quality parts ensure long-term stability and reliability.
  • ◉ Strict accuracy control traceable to national standards ensures high quality with high inter-instrument agreement.
  • ◉ Selectable measurement areas: Measurement areas of Ø25.4mm, Ø8mm, and 3×5mm (rectangular) can be selected according to the application.
  • ◉ Switchable between SCI and SCE measurements
  • ◉ Side less transmittance chamber for unlimited sample length (Maximum thickness: Approx. 50 mm)
  • ◉ Long sample holder arm enables sample measurement at center of A4-size
  • ◉ Sample holder arm stays open when opened fully for easy positioning of thick samples.
  • ◉ USB communication interface for easy connection and high speed communication
  • ◉ Frame around power switch prevents switching power off by mistake

Application

  • ◉ Automobile, Chemical, Construction,Cosmetics, Electronics, Food, Medical, Paint, Pharmaceuticals,Plastics.

Specification

llumination/viewing system

Reflectance: di:8° , de:8° (diffuse illumination, 8° viewing angle)
SCI (specular component included) / SCE (specular component excluded) switchable
Conforms to CIE No.15, lSO 7724/1, ASTM E 1164, DIN 5033 Teil 7 and JIS Z 8722 condition c standard.
Transmittance:di:0° , de:0° (diffuse illumination, 0° viewing angle)
Conforms to CIE No.15, ASTM E 1164, DIN 5033 Teil 7 and JIS Z 8722 condition g standard.
Detector Silicon photodiode array with flat holographic grating
Wavelength range  360nm to 740nm.
Wavelength pitch 10nm.
Light source Pulsed xenon arc lamps.
Minimum  measurement interval 3 seconds
Illumination/ measurement area

Reflectance:

Changeable between LAV, MAV, and SAV
SAV: 5 × 7 mm illumination/3 × 5 mm measurement
MAV: Ø 11 mm illumination/Ø8 mm measurement
LAV: Ø28 mm illumination/Ø25.4 mm measurement30mm/34mm.
Transmittance:  Ø2m illumination/Approx. Ø20 mm
UV adjustment  Computer controlled; Continuously variable; 400 nm cutoff filter
Interface  USB 1.1